X-ray Crystallography Solutions and Technology by Angstrom Advanced
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Introduction:
Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for application in the micro-structure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software, ADX-2500 is a diffraction system according to the practical requirements in many fields.
Angstrom Advanced Inc. ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample. ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis (ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for application in the micro-structure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software, ADX-2500 is a diffraction system according to the practical requirements in many fields.
Angstrom Advanced Inc. ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample. ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis (ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
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Features:
- Perfect incorporation of the hardware and software allows the ADX-2500 to perform different types of analysis for researchers from various fields.
- High precision of the diffraction angle measurement allows the ADX-2500 to obtain the more accurate data.
- Higher stability of the X-ray generator control system provides excellent measurement accuracy.
- Simple and effective design makes the ADX-2500 convenient for operation and user friendliness.
Software:
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.
- Profile fitting and overlapped peeks separation - With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain.
- Qualitative Analysis - The data processing software from Angstrom Advanced has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
- Quantitative Analysis - After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion).
- Plot and Export - The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Specifications:
X-ray Generator | Control mode | 1kV/step, 1mA/step controlled by PC |
Rated output power | 3 kW | |
Tube voltage | 10-60 kV | |
Tube current | 5-80 mA | |
X-ray tube | Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2 |
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Stability | ≤ 0.01% | |
Goniometer | Goniometer | vertical frame |
Diffraction circle semi-diameter | 185mm | |
Scan range of 2θ | -15°-164° | |
Continuous scanning rate | 0.06°-76.2°/min | |
Setting speed of angle | 120°/min | |
Scan mode | θ-2θ linkage, θ,2θ one way: continuous or step scanning | |
One way repeatability of 2θ | ≤ 0.001° | |
Minimal stepping angle | 0.001° | |
Precision of 2θ | ≤ 0.005° | |
Record Unit | Counter | PC or SC |
Maximal CPS | 5×106 CPS | |
Proportion counter energy spectrum resolution | ≤ 25%(PC), ≤ 55%(SC) |
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Detectable high voltage | 1500-2100 V continuous tune | |
High voltage of the counter | differential or integral, automatic PHA, dead time emendation | |
System detector stability | ≤ 0.01% | |
Integrated performance | Dispersion dosage | ≤ 1μSv/h |
Integrated stability of the system | ≤ 0.5% | |
Dimension | 1000 × 800 × 1640 mm |
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Introduction:
The Angstrom Advanced Inc ADX-2700 Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX-2700 is a diffraction instrument designed for the challenges of modern materials research. ADX-2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX-2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.
The Angstrom Advanced Inc ADX-2700 Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX-2700 is a diffraction instrument designed for the challenges of modern materials research. ADX-2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX-2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.
Features:
Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis, Crystallography, Texture analysis, Transmission, Thin film analysis. Angstrom Advanced ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature. ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable Accessories: Angstrom Advanced AHTK 1000 high temperature attachment:
Angstrom Advanced ALTK-450 Variable temperature attachment:
Software: General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, mulriple plot, three-dimensional plot and simulation of XRD pattern.
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Specifications:
X-ray Generator | Control mode | 1kV/step, 1mA/step controlled by PC |
Rated output power | 4 kW | |
Tube voltage | 10-60 kV 1kV continuously adjustable | |
Tube current | 5-80 mA continuously adjustable | |
X-ray tube | Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2 |
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Stability | ≤ 0.0005% mains fluctuation | |
Goniometer | Goniometer | theta(θ)/theta(θ) |
Diffraction circle semi-diameter | 285mm | |
Scan range of θ | -3° to +160° | |
Continuous scanning speed | 0.006-96°/min | |
Setting speed of angle | 1500°/min | |
Scan mode | θ-θ or θ, θ; Continuous or step scanning | |
One way repeatability of θ | ≤ 0.0002° | |
precision of θd or θs | ≤0.005° | |
Minimal stepping angle | 0.0001° | |
Record Unit | Counter | PC or SC |
Maximal CPS | 5x10^6 CPS | |
Proportion counter energy spectrum resolution | ≤ 25%(PC), ≤ 50%(SC) | |
Detectable high voltage | 1500-2100 continuous tune | |
High voltage of the counter | differential or integral, automatic PHA, dead time emendation | |
ADX-DWZ | System detector stability | ≤ 0.01% |
Micro Structure | Micro Structure analysis, +/-0.5nm | |
Micro-Diffraction | Micro sample or area, 2nm-19 um | |
Integrated performance | Dispersion dosage | ≤ 1μSv/h |
Integrated stability of the system | ≤ 0.5% | |
Dimension | 1000 × 800 × 1640 mm |
Introduction:
The AXFQ series flaw detectors by Angstrom Advanced are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on.The glass x-ray tube allows to get images of excellent quality and clarity.
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Introduction:
Angstrom Advanced AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate non destructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure. Specifications:
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Introduction:
Angstrom Advanced AXFG series portable X-ray flaw detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tube are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, AXFG X-ray flaw detector is the best choice for most applications. Specifications:
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